منابع مشابه
High spatial resolution surface imaging and analysis of fungal cells using SEM and AFM.
We review the use of scanning electron microscopy (SEM), atomic force microscopy (AFM) and force spectroscopy (FS) for probing the ultrastructure, chemistry, physical characteristics and motion of fungal cells. When first developed, SEM was used to image fixed/dehydrated/gold coated specimens, but here we describe more recent SEM developments as they apply to fungal cells. CryoSEM offers high r...
متن کاملDetection of Microsatellite Instability by High-Resolution Melting Analysis in Colorectal Cancer
Background: Colorectal cancer (CRC) is the third most common cancer worldwide. microsatellite instability (MSI) is a molecular marker of a deficient mismatch repair system and happens in almost 15% of CRCs. Because of a wide frequency of MSI+ CRC in Iran compared to other parts of the world, the importance of screening for this type of cancer is highlighted. Methods: The most common MSI detecti...
متن کاملDouble layer coating for high resolution low temperature SEM
Specimen damage caused by mass loss due to electron beam irradiation is a major limitation in Low Temperature Scanning Electron Microscopy of bulk specimens. At high primary magnifications (e.g. 100 000 x) a hydrated sample is usually severely damaged after one slow scan (about 3000 enm-2). The consequences of this beam damage are remarkably reduced by coating the frozen-hydrated sample with a ...
متن کاملبررسی حساسیت و اختصاصیت روش high resolution melting analysis در شناسایی انواع جهش های مختلف ژن rb1
روش های متنوعی برای شناسایی جهش ها ابداع شده است که هریک از آنها دارای مزایا و معایب خاص خود هستند. یکی از روش هایی که اخیراً ابداع شده و در مطالعات مختلف به کارآیی بالای آن اشاره شده است روش high resolution melting analysis یا hrm است. در مطالعه حاضر برای اولین بار در ایران به منظور شناسایی جهش ها تمامی اگزون های ژن rb1 با استفاده از روش تعیین توالی بررسی شده است. در ادامه به منظور بررسی حساسیت...
D uble layer coating for high resolution low temperature SEM
Specimen damage caused by mass loss due to electron beam irradiation is a major limitation in Low Temperature Scanning Electron Microscopy of bulk specimens. At high primary magnifications (e.g. 100 000 x) a hydrated sample is usually severely damaged after one slow scan (about 3000 enm-2). The consequences of this beam damage are remarkably reduced by coating the frozen-hydrated sample with a ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of the Japan Welding Society
سال: 1988
ISSN: 0021-4787,1883-7204
DOI: 10.2207/qjjws1943.57.85